Process Control

April 26 - 29, 2020 | Atlanta, GA, USA

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Process Control (PC)

The Process Control track will focus on process measurement and control. 


Process Control Track Program

Visit our website often for program updates as the program is subject to change


Sunday, April 26

3:00PM – 5:00PM Process Control Division Council (Steering) **  
Monday, April 27          
1:30PM – 3:00PM
PC1: Future Visions for Use of QCS
    Session Chair: Seyhan Nuyan, Valmet  
      PC1.1 Method for Analyzing Cross-Direction Basis Weight Profile on Multi-Ply Machines Kim William Robinson, Process Solutions Group
      PC1.2 CD Actuator Mapping Expression and Analysis Shih-Chin  Chen , ABB
      PC1.3 Measuring Key Properties of Paper and Board - A New Approach Mark Crable, TSP Oncare & Verso Co
2:00PM – 3:00PM Process & Product Quality Division Council **  
3:30PM – 5:00PM
PC2: Visions for Effective Use of Data
    Session Chair: Ian Journeaux, Georgia-Pacific  
      PC2.1 Cloud Connected QCS – Achieving Sustained Peak Performance with Limited Resources Johan Backström, Honeywell
      PC2.2 Advanced Data Strategies for Papermaking Optimization Donald Stanley III, ABB
      PC2.3 Big Data Analytics: Lessons Learned and Case Studies John Antanies, Envoy Development

Tuesday, April 28

8:00AM – 10:00AM
M5A-PC3: Visions for Mill Automation Success
    Session Chair: David Worzalla, International Paper & David Pawelke, MAJIQ
      M5A-PC3.1 Data Governance as the Backbone of Information Value Laurie Dieffenbach & William Carrillo, OSIsoft
      M5A-PC3.2 Future of MES - Towards Autonomous Mills Timo Arra, TietoEVRY
      M5A-PC3.3 How to Keep Advanced Process Controls (APCs) operational longer than 24-months David Zerr, Georgia-Pacific
      M5A-PC3.4 How to Make Sure Your Process Improvement Project Lives On After You've Moved On Robert White, Pulmac Systems International
1:30PM – 3:00PM
PC4: Machine Vision… Into the Future 1
    Session Chair: Brian Mock, Event Capture Systems  
      PC4.1 Technical Advances in Web Inspection and Process Efficiency Pete Angle, ISRA VISION
      PC4.2 Increasing Uptime in WIS and Event Capture Solutions with Server Virtualization Wesley Sweeny, Procemex
      PC4.3 Comprehensive Performance Tests of the Paper Product Formation and Surface Appearance Quality Analysis and Classification System Tommi Huotilainen, ABB
2:00PM – 4:00PM Quality & Standards Management Committee   
3:30PM – 5:00PM
PC5: Measurement Technologies for the Future
    Session Chair: Shih-Chin Chen, ABB  
      PC5.1 Analysis of Roughness Measurements of Coated Cardboards Sandra Rosalen, Bergische Universität Wuppertal
      PC5.2 An Online and Real-time Process Analyser for Closed-loop Control in Pulp & Paper Manufacturing Jonathon Speed, Keit Spectrometers
      PC5.3 Successful Process Optimization Using Advanced Analytics and Machine Learning for Critical Quality Parameters Cydney Rechtin, Solenis

Wednesday, April 29

8:00AM – 10:00AM
PC6: A Clear Vision of Field Devices
    Session Chair: Michael Von Grumbkow, BTG  
      PC6.1 Lessons Learned in Alarm Management Dave Strobhar, Beville Engineering
      PC6.2 Specifications for Effective Electrical Room Corrosion Control Mark Bradham, Advance Industrial Refrigeration
      PC6.3 Measurement Made Easy for your Pulp and Paper Processing Applications Kevin Green, ABB
      PC6.4 Consistency Measurement and Basic Tenets of Loop Design Craig Hannah, Valmet
10:30AM – 12:00PM
PC7: Controls Handbook Tutorial
    Session Chair: Kerry Figiel, International Paper  
      PC7.1 Control Handbook Tutorial: Fundamental Process Control Concepts  Jack Tippett, Emerson Automation Solutions
      PC7.2 Machine Direction Quality Control Approaches Michael Forbes, Honeywell
      PC7.3 Control Handbook Tutorial: Cross Machine Actuators - Caliper Control Jonathan Crawford, Honeywell
12:00PM – 1:30PM Process Control Division Council*  
1:30PM – 3:00PM
PC8: Machine Visions…Into the Future 2
    Session Chair: Wesley Sweeney, Procemex  
      PC8.1 Vision System Are For More Than Web Breaks, Let's Talk About Control Vince Williamson, ABB
      PC8.2 Measurement of S and Na Distribution in Impregnated Wood Chip by XRF Hafizur Rahman, Mid Sweden University
      PC8.3 Case Study - Using Deep Learning to Classify Incoming Wood Chip Quality Brian Mock, Event Capture Systems